Cetim Facility Receives Bruker Contour CMM Dimensional Analysis System

Bruker’s Nano Surfaces Division and Cetim have announced that Bruker has delivered its Contour CMM Dimensional Analysis System to the Cetim Carnot Institute in France. In a collaborative agreement, Cetim will validate the system’s measurement accuracy and performance across a wide variety of applications at their Picard facility over the next year. In addition, Cetim will offer European manufacturers precision measurement services with the Contour CMM. The new instrument enables the ability to perform simultaneous nanoscale surface height, roughness, texture, and 3D form measurements for geometric dimensioning and tolerancing (GD&T). The delivery of this innovative platform opens the door to high-precision 3D scanning for aeronautics, automobile, medical, and precision machining sectors.

Contour CMM Enables High-Precision 3D Scanning

“The Contour CMM provides multiple unique capabilities within a single instrument, and like our institute, serves as a crossroads between research and industry,” said Gilles Jalabert, Head of Cetim’s metrology laboratory. “With this equipment, Cetim now offers our customers a complete 3D metrology capability, from measurement drones for very large or inaccessible items to high-precision scans of small items for 3D surface and form measurements.”

“We chose Cetim because they are uniquely positioned to thoroughly explore the capabilities of the Contour CMM system, and they have the know-how to actively participate in suggesting improvements to the system. In addition, their strong reputation will help introduce Contour CMM’s unique capabilities to a variety of precision manufacturing companies in Europe,” added James Earle, Vice President and General Manager of Bruker’s Tribology, Stylus and Optical Metrology Business. “With this partnership, we expect the Contour CMM system will demonstrate its capabilities in many ground-breaking application.”

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